Full-wave EM simulation can capture the behavior of RFID devices in great detail, making it possible to investigate how a tag will behave without constructing a prototype.įigure 1: H-field (left) and surface current density (right) for a typical LF RFID tag. Interference and shielding effects can both affect the performance of tags, and they need to be taken into account when considering an RFID system. This means that RFID can be very sensitive to other objects in the environment. Instead, the power to run the tag is supplied by the interrogating reader through a near-field or far-field coupling to the reader. Most RFID tags in common use are passive, which means that they don’t carry any power source. When interrogated by an RFID reader, this chip generates a unique data string which allows the tag to be identified and, if necessary, can provide additional information to the reader.įor the purposes of simulation, RFID systems can be divided broadly into two groups: low frequency (frequencies up to tens of megahertz) and high frequency (hundreds of megahertz or greater). At the heart of all RFID systems is the tag – an inductive coil or antenna usually connected to a small microchip. Radio frequency identification (RFID) makes it possible to catalogue, label and track items quickly in demanding environments.
Analyzing the entire system with simulation allows the suitability of the chosen RFID system for the application to be investigated, and can reveal unforeseen interactions that can be hard to identify with measurement alone. This can be done at the level of the individual tag, but also for the entire system, including the reader, the tagged object and its surroundings. RFID and wireless power transfer simulation from tag to system This article discusses the design and modeling of both low frequency (LF) and high frequency (HF) RFID devices using CST® STUDIO SUITE®.
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